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Digital Sessions

Using Fiction to Advance Science: Film, Video Games, and Technology with NADI and Confluent des Savoirs! 
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Article

University and democracy: a living, sometimes threatened, link

Trust of traditional political institutions and elected representatives, rise of authoritarian logics, definition of public services... Democracy today seems to be going through a turbulent zone. What role does the university play in this context? To shed light on this question, we interviewed four researchers from different disciplines: educationalist Sephora Boucenna, philosopher Louis Carré, political scientist Vincent Jacquet and legal scholar Aline Nardi. Their contrasting views sketch out the contours of an issue that is more topical than ever: thinking about and defending the link between university and democracy.
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Atomic force microscopy (AFM)

Description Nanoscope IIIa Multimode, Bruker. Applications Surface and materials sciences Expertise Acquisition of images of organic and biological molecular films, nano-objects and nanostructures, inorganic deposits, with nanometric resolutionInformation on morphology, size, roughness of imaged systems Location Faculty of Science, Building B9, Floor -1, Room #-144 Contact Francesca Cecchet - Academic and technical managerfrancesca.cecchet@unamur.be
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Light microscopy

Our platform offers a wide range of fluorescence microscopes covering a broad field of applications. We offer 2D, 3D and 4D imaging approaches, suitable for studying isolated cells, spheroids or organoids, complex tissues or entire small organisms. Our equipment allows you to observe subcellular structures at the nanometric scale and track highly dynamic cellular processes.
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Services: characterization and functionalization

Characterization and functionalization solutions The SIAM platform can provide characterization and/or analysis solutions in fields such as photovoltaics, smart coatings, nanomaterials, public health, and biomedical applications, to name but a few. Our client portfolio covers several industrial sectors, SMEs, and universities. Our clients benefit from a comprehensive technical approach (one-stop shop) thanks to our research logisticians, who provide support from the initial request to the delivery of results. Learn more about the SIAM platform Expertise See content Equipment See content Case studies See content Team See content Contact | Technology platforms Synthesis, Irradiation, and Analysis of Materials (SIAM) siam@unamur.be
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Cutting-edge equipment

Several state-of-the-art instruments enable the synthesis, irradiation, functionalization, and analysis of samples:X-ray photoelectron spectroscopy (XPS)Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)Ion beam analysis (IBA)Ion beam functionalization (IBMM)Plasma treatment (PECVD, DC, RF, and AC)
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Case studies

SIAM offers you some examples of services according to the technique used.
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The SIAM team

Director | Julien Colaux Julien Colaux holds a PhD in physics. His expertise covers nuclear physics (ion beam analysis (IBA), ion implantation) and the development of thin films using PVD and PECVD.Contact: julien.colaux@unamur.be  Spokesperson | Pierre Louette Pierre Louette holds a PhD in physics and is a certified secondary school teacher. His expertise covers electron spectroscopy techniques (XPS, HREELS, EELS, etc.) and physics education.Contact: pierre.louette@unamur.be  IBA Expert | Paul-Louis Debarsy Contact: paul-louis.debarsy@unamur.be  Surface analysis expert | Alexandre Felten Contact: alexandre.felten@unamur.be   ALTAÏS Engineer | Tijani Tabarrant Contact: tijani.tabarrant@unamur.be  Senior Technician | Frédéric ComeAdministrative Assistant | Olivia Genot Contact | Technology platforms Synthesis, Irradiation, and Analysis of Materials (SIAM) siam@unamur.be
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Contact

Contact | Technology platforms Synthesis, Irradiation, and Analysis of Materials (SIAM) siam@unamur.be
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IBA - Ion Beam Analysis

IBA uses MeV ion beams to probe the composition and obtain elemental depth profiles in the near-surface layer of solids.This technique enables: The analysis of the biodistribution and biopersistence (in vivo) of nanomaterials, their characterization and quantification;The characterization of thin-film materials and airborne particles;The study of phase transformation.For decades, the IBA has played a leading role in nuclear astrophysics, materials science, life sciences, heritage sciences, and archaeology.
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IBMM - Ion Beam Modification

Ion Beam Modification of Materials (IBMM) allows the electronic, optical, mechanical, or magnetic properties of various materials to be modified in a controlled manner. This is known as functionalizing materials.This process allows precise control of the composition and structure of materials at the atomic level, paving the way for applications in electronics, biomaterials, and specialized coatings.
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PECVD, DC, RF, and AC - Plasma treatment

Plasma sputteringA process in which energetic particles from a gas plasma bombard a solid target material, dislodging (sputtering) its atoms. These ejected atoms then deposit onto a substrate, forming an ultra-thin layer. This is a type of physical vapor deposition (PVD) used to create coatings and thin films for various applications, including semiconductor manufacturing, optical devices, and wear-resistant surfaces.4 chambers for plasma sputtering (DC, RF, and AC)Plasma functionalization Thin film deposition PECVD deposition PECVD (plasma-enhanced chemical vapor deposition) is a thin film deposition technique that uses plasma energy to activate gaseous precursors, causing them to react and form a solid film on a substrate. The main advantage of PECVD is that it operates at lower temperatures than conventional CVD, allowing high-quality films to be deposited on temperature-sensitive materials and creating various insulating, protective, and electronic layers in the fields of microelectronics, optics, and packaging.4 chamber for PECVD deposition and functionalization Powder processing Other related equipment and technologies Image IBA - Ion Beam Analysis See content Image IBMM - Ion Beam Modification See content Image ToF-SIMS - Time-of-flight secondary ion mass spectroscopy See content Image XPS - X-ray Photoelectron Spectroscopy See content
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