RESOLUTION

• High vacuum mode
  4.0 nm at 20 kV
  8.0 nm at 3 kV
  15.0 nm at 1 kV
• Low vacuum mode
  5.0 nm at 20 kV

GROSSISSISSION

8X to x 300kX

IMAGING MODE

• secondary electron (SEI)
• backscattered electron (BEI)

QUANTAX SDD energy-selective X-ray microanalyzer and Detector for backscattered electron diffraction (EBSD) e-Flash QUANTAX from BRUKER

• Energy resolution < 129 eV at MnKa
• Size 30 mm²
• Effect-cooled
• Excellent performance in light and low-energy elements, B - Am element range
• CMOS imaging
• Image resolution: 720 x 540 pixel
• Speed: up to 520 frames/second (fps)
• Data acquisition and processing are carried out using the same interface.

RESOLUTION

• 1.0 nm at 15 kV
• 1.4 nm at 1 kV (Gentle beam mode)
• 2.0 nm at 1 kV (SEM mode)

GROSSISSING

• 25X to 1000kX

IMAGINGODES

• in secondary electrons (2 detectors SEI or LEI)
• backscattered electrons (LABE)
• transmitted electrons (TED)

ACCELERATION POTENTIAL

• EMS mode: 0.5 to 30 kV (in 10 V steps from 0.5 to 2.9 kV and in 100 V steps from 2.9 to 30 kV)
• GB mode: 0.1 to 4 kV (in 100V steps)

Energy-selective X-ray microanalyzer JED-2300F

• Detector: Ultra Nine 30
• Size 30 mm²
• Liquid nitrogen cooling (Dewar 9.5 l)
• Resolution better than 138 eV (FWHM) on the Ka manganese line
• Detection from Boron to Uranium