SOURCE

W filament

PERFORMANCE AT 100 KV

• TEM point resolution : 0.42 nm
• TEM line resolution : 0.34 nm
• TEM Magnification range : 19X - 530kX

IMAGING MODES

• bright field mode
• dark field mode

ACCELERATION POTENTIAL

• from 40 kV to 100 kV

SOURCE

LaB6 filament

PERFORMANCE AT 200KV

• TEM point resolution : 0.27 nm
• TEM line resolution : 0.14 nm
• TEM Magnification range : 25X - 700kX

MODE STEM - HAADF DETECTOR

• STEM Resolution : 1 nm
• STEM magnification range : 100X - 5MX

ACCELERATION POTENTIAL

• from 80 kV to 200 kV

BRUKER QUANTAX SDD energy-selective X-ray microanalyzer

• Detector: XFlash®6 (Dry Silicon Drift SDD)
• Size 30 mm²
• Peltier cooling
• Resolution better than 129 eV (FWHM) on the Ka manganese line
• Detection from berillium
• ESPRIT control software

Source

Cold FEG

PERFORMANCE AT 200 KV

• TEM point resolution : 0.27 nm
• TEM line resolution : 0.14 nm
• TEM Magnification range: 25X - 700kX

STEM MODE AT 200 KV

• STEM Resolution: 0.19 nm
• STEM magnification range: 100X - 5MX

ACCELERATION POTENTIAL

• 80, 120 kV and 200 kV

Cryogenic sample holder with pump station (SIMPLE ORIGIN)

• Double-grid cryogenic sample holder
• Maintains low, stable sample temperatures at around -175°C for around 10 hours
• ± 60° tilt (on F200 cryo pole piece)